Low temperature coefficient current sensor

ABSTRACT

A system current sensor module can accurately sense or measure system current flowing through a sense current resistor by shunting current through a gain-setting resistor and using an amplifier to measure a resulting voltage, with an output transistor controlled by the amplifier controlling current through the gain setting resistor in a manner that tends to keep the amplifier inputs at the same voltage. The resistors can be thermally coupled to maintain similar temperatures when a system current is flowing. The thermal coupling can include conducting heat from a first resistor layer carrying the current sense resistor to a thermal cage layer located beyond a second resistor layer carrying the gain-setting resistor. This preserves accuracy, including during aging.

CLAIM OF PRIORITY

This patent application claims the benefit of priority of U.S.Provisional Patent Application Ser. No. 62/755,881 entitled INTEGRATEDLOW TEMPERATURE. COEFFICIENT CURRENT SENSOR, which was filed on Nov. 5,2018, which is hereby incorporated herein by reference in its entirety.

TECHNICAL FIELD

This document pertains generally, but not by way of limitation, to anelectrical current sensor, and more particularly, but not by way oflimitation, to a laminate-based “zero” temperature coefficient currentsensor.

BACKGROUND

Sensing large currents on a printed circuit board (PCB), such as can befound at the 12V DC input to a server or network switch, can requireusing a sense element that is capable of passing large currents safelyand with minimal power loss. For sensing input currents in excess of 100amperes, a sense element resistance on the order of 100 μΩ or less maybe needed. Such a sense element can come in the form of a discrete senseresistor, such as can be soldered to the PCB, or even a resistor formedby the resistance of a PCB trace itself The voltage developed across thesense resistance can be measured using an analog-to-digital converter(ADC) in the system, which can be further conditioned orsignal-processed to produce a value indicating the sensed current (e.g.,in Amperes) representing the current through the sense element.

Discrete sense resistors having low temperature coefficients tend to bemade from exotic materials, such as iron-chrome or manganese-copperalloys. These exotic materials can achieve a low temperature coefficientof resistance (TCR) but can be expensive. Accurately sensing the voltageacross such a sense resistor element can also be difficult, given thelarge current (resulting in ohmic “IR” voltage drops across the PCB) anda small voltage drop across the sense resistor being used as the currentsense element, as is needed to maintain a reasonable power dissipationin the sense resistor. Some Kelvin-sense resistors are available, suchas can include sense points integrated into the sense resistor, butthese tend to be even more expensive.

Another way of sensing large currents is by using a section of a copperPCB trace itself as the current sense element. This has the advantagethat the PCB trace already exists on the PCB and no additional voltagedrops (such as due to a discrete sense element) need to be introduced.However, copper has a large TCR (3900 ppm/° C.). Thus, as the PCBchanges temperature, either due to ambient temperature changes or due tothe power dissipation from the IR drop across the copper trace, theabsolute resistance of the sense element will change. While this effectcan be compensated, such as by using a temperature sensor near the senseelement and some analog or digital signal conditioning in themeasurement circuitry, such temperature compensation involves additionalcomplexity.

Furthermore, the accuracy of a discrete current sense resistor, or thethickness and width of the PCB trace, may not be controlled well enoughto achieve the desired final system accuracy. Trim techniques can beapplied to the final PCB assembly, but this adds test cost andcomplexity to the PCB manufacturing process, assuming that the currentcan be externally measured or applied accurately enough to achieve thedesired trim target.

SUMMARY

The present document explains how a system current sensor module can beprovided to accurately sense or measure system current flowing through acurrent sense resistor. The present approach can include shuntingcurrent through a gain-setting resistor and using an amplifier tomeasure a resulting voltage. An output transistor can be controlled bythe amplifier, such as for controlling current through the gain settingresistor, such as in a manner that tends to keep the amplifier inputs atthe same voltage. The current sense resistor and the gain settingresistor can be thermally coupled, such as to help maintain similartemperatures in the sense current resistor and the gain setting resistorwhen a system current is flowing. For example, the thermal coupling caninclude conducting heat from a first resistor layer (e.g., carrying thecurrent sense resistor) to a thermal cage layer that can be locatedbeyond a second resistor layer (e.g., carrying the gain-settingresistor). This can help preserve current sensing and measurementaccuracy, in spite of thermal effects, including thermal effects due toaging of the part. Trim adjustment techniques, such as for calibration,are also described in this document. This summary/overview is intendedto provide an overview of subject matter of the present patentapplication. It is not intended to provide an exclusive or exhaustiveexplanation of the invention. The detailed description is included toprovide further information about the present patent application.

BRIEF DESCRIPTION OF THE DRAWINGS

in the drawings, which are not necessarily drawn to scale, like numeralsmay describe similar components in different views. Like numerals havingdifferent letter suffixes may represent different instances of similarcomponents. The drawings illustrate generally, by way of example, butnot by way of limitation, various embodiments discussed in the presentdocument.

The patent or application file contains at least one drawing executed incolor. Copies of this patent or patent application publication withcolor drawing(s) will be provided by the Office upon request and paymentof the necessary fee.

FIG. 1 shows an example of a current sense amplifier architecture.

FIG. 2 is a circuit schematic diagram that shows an approach of trimminggain.

FIG. 3 shows an example in which the gain setting resistor can be formedfrom at least two series components R2 and R3, at least one of which caninclude or be coupled to a larger resistance shunt resistor in parallel.

FIG. 4 illustrates a circuit schematic example of forming a thermalcage.

FIG. 5 shows an pictorial example of a layered thermal cage technique ofthermally coupling the sense resistor and the gain-setting resistor

FIG. 6 shows a cross-sectional view further illustrating certain aspectsof FIG. 5.

FIG. 7 shows an example of prototype experimental test results of outputcurrent, Iout (in milliamperes) measured at the terminal IOUT vs. systemcurrent (amperes) between terminals IP and IM for five differentprototype parts.

FIG. 8 shows an example—after trimming such as described herein—of suchprototype experimental parts, with the y-axis of the graph representingpercent error to an ideal straight line fit of output current, Iout, (inmilliamperes) vs. the x-axis representing system current (amperes)between terminals IN and OUT for five different prototype parts.

DETAILED DESCRIPTION Current Sensing Circuit Architecture

The present approach can help overcome the problems explained above.FIG. 1 shows an example of a current sense amplifier architecture. InFIG. 1, the current “sense” resistor 100 between the “IP” terminal andthe “IM” terminal, having resistance value of R (e.g., on the order of100 μΩ or less), can serve as the primary current sense element. Thelarge “system current” from the system flows through this current senseresistor 100. A “gain-setting” resistor 102 can be electricallyconnected or coupled between the “IP” terminal and the inverting inputof the amplifier 104. The gain setting resistor 102 can have aresistance value of n·R, such that the resistances of the current senseresistor 100 and the gain-setting resistor 102 can be scaled withrespect to each other by a specified amount, such as can be specified bya scaling factor n. The non-inverting input of the amplifier 104 can becoupled to the “IM” terminal of the amplifier 104, which node canoptionally also be used to supply power to the amplifier 104 (or theamplifier 104 can be powered via a different or separate power supplyrail, if desired). The output terminal of the amplifier 104 can becoupled to the gate of a p-channel or other field-effect transistor(FET) or other transistor 106, such as can be located in series betweenthe gain-setting resistor 102 and the “IOUT” terminal. Such anarrangement can allow the amplifier 104 to close the loop in such a wayto force the same voltage across the gain-setting resistor 102 asappears across the current sense resistor 102, by virtue of thevirtual-ground that exists between the non-inverting and invertinginputs of the amplifier 104 when the amplifier 104 is operated in such aclosed-loop manner, such as shown in the example of FIG. 1. In doing so,a scaled sensed current I_(OUT)=[I_(LOAD)/n] flows out the IOUT terminalor port. This current, I_(OUT), is proportional to the current flowingfrom the IP terminal to the IM terminal.

If both the current sense resistor 100 and the gain-setting resistor 102are constructed from the same material (e.g., copper, on a laminatesubstrate), and are at the same temperature, the temperature coefficientof resistance (TCR) of either of the current sense resistor 100 or thegain-setting resistor 102 does not matter in terms of the impact on thescaled sensed current I_(OUT). The ratio of the resistance values of thecurrent sense resistor 100 and the gain-setting resistor 102 remains thesame (e.g., “n”) regardless of changes in their absolute resistancevalues due to temperature and their respective TCRs.

The two primary error sources in the architecture shown in FIG. 1 are anerror in the resistance ratio between the current sense resistor 100 andthe gain-setting resistor 102, and an error due to the input offsetvoltage of the amplifier 104. The resistance ratio is determined by thephysical construction of the sense resistor 100 and the gain-settingresistor 102, and the tolerances involved in manufacturing theseresistors (e.g., such as which can arise from a copper etch variation,or copper thickness variation). Adjusting or “trimming” the gain toaccount for the resistor ratio (n) errors can be achieved in one or moreof several different ways.

FIG. 2 is a circuit schematic diagram that shows an example of anapproach of trimming gain. In FIG. 2, the PFET 106 can be split intomultiple parallel PFET segments 106A, . . . , 106N, such as withindividually addressable and switchable drain terminals. Atmanufacturing, trimming can be accomplished by selectably switching acertain number of the drains of those PFET segments 106A-N to supply theI_(OUT) current to the terminal IOUT, with the drains of the other PFETsegments 106A-N being selectably switched, such as to selectably directtheir respective source-drain currents to some node other than IOUT,such as to a GND terminal, such as shown in the example of FIG. 2.

In another example, adjusting or trimming the gain can be achieved suchas by placing a large value shunt resistor in parallel to thegain-setting resistor 102 of resistance value n·R, or a portion thereof,and then selecting a tap point on that large value shunt resistor forcoupling to the inverting input to the amplifier 104. This has theeffect of taking a fraction of the voltage across the gain-settingresistor 102 of resistance value n·R to use as the feedback resistancevalue for the amplifier 104. As long as the fraction used of the largevalue shunt resistor remains stable with temperature and over time, thegain adjustment will remain stable.

FIG. 3 shows an example in which the gain setting resistor 102 can beformed from at least two series resistance components R2 and R3, atleast one of which (e.g., R3) can include or be coupled to a largerresistance shunt resistor in parallel. For example, such parallel shuntresistor can include the series combination of R10, R11, R12, . . . ,R137. In FIG. 3, the larger resistance shunt resistor providing tappoints can be selectively coupled to the inverting input of theamplifier 104, such as via a multiplexer circuit 300. In the example ofFIG. 3, the large shunt resistor can include an interpolation stringsuch as a series combination of resistors, e.g., R10, R11, R12, . . . ,R137 with tap points provided between or across such individualresistors R10, R11, R12, . . . , R137 for allowing such individual tappoints to be selectively multiplexed to the inverting input of theamplifier 104. The gain-setting resistor 102 component 102A can have aresistance value of (n−m)·R and the gain-setting resistor 102 component102B can have a resistance value of m·R, such that the sum of theseresistance values is equal to the resistance n·R of the gain-settingresistor 102 of FIG. 1. The series resistance value of the interpolationstring formed by series combination of resistors, e.g., R10, R11, R12, .. . , R137 can be set to be much larger than the resistance value m·R ofthe component 102B of the gain-setting resistor 102 IOUT in paralleltherewith, such that only a small fraction of the current through 102Bflows through the series combination of resistors, e.g., R10, R11, R12,. . . , R137. The approach shown in FIG. 3 has the benefit that theoutput current at the node or port I_(OUT) is precise and no current(e.g., beyond that used to power the amplifier 104) need be shunted toground during current sensing and measurement, such as was shown in theapproach of FIG. 2.

Thermal Stability

The present inventors have recognized, among other things, that it canbe helpful to keep the two resistors (e.g., the sense resistor 100 ofresistance R and the gain-setting resistor 102 of resistance n·R) at thesame temperature, such as to help maintain a stable gain n overtemperature and to help reduce errors due to aging. Since the largestpower dissipation will occur in the primary sense resistor 100 ofresistance R (which can have the full, large, system current flowingthrough it), the gain setting resistor 102 of resistance n·R can beconstructed so as to be thermally coupled to the sense resistor 100,such that both of these resistors 100, 102 are at about the sametemperature and experience the same temperature variations. This caninclude forming a “thermal cage” to help keep the sense resistor 100 andthe gain-setting resistor 102 at the same temperature, such as shown inthe schematic example of FIG. 4. In the illustrative, non-limitingexample of FIG. 4, the current sense resistor 100 is shown as having aresistance value of R=80 microOhms and the gain-setting resistor 102 isshown as having a resistance value of n·R=2 Ohms. For example, atechnique of thermally coupling the sense resistor 100 and thegain-setting resistor 102 can include forming both such resistors 100,102 on the same PCB layer, such as side-by-side, or such as with one ofthe resistors 100, 102 being encompassed or peripherally surrounded bythe other of the resistors 100, 102.

FIG. 5 shows a pictorial example of a technique of forming a layeredthermal cage for thermally coupling the sense resistor 100 and thegain-setting resistor 102, such as which can include forming the gainsetting resistor 102 on a layer of the PCB that is adjacent to, andstacked vertically against, a layer of the PCB on Which the senseresistor 100 is formed.

To help ensure sufficient thermal coupling between the sense resistor100 and the gain-setting resistor 102, a thermal “cage” can be providedaround the gain setting resistor 102. In FIG. 5, such a thermal cage isshown as being constructed by sandwiching the layer 502 upon which thegain-setting resistor 102 is formed between the layer 500 upon which thesense resistor 100 is formed and a superjacent or overlaying thermallyconductive cage layer 504. The thermally conductive cage layer 504 canbe located or positioned in layered-registration with the area regionoccupied by the underlying sense resistor 100. The thermally conductivecage layer 504 can be relatively more thermally conductive than eitheror both of the layers 500, 502. The PCB layers 500 and 502 upon Whichthe sense resistor 100 and gain-setting resistor 102 are formed caninclude one or more thermally conductive vias 506, such as can quicklyand efficiently conduct heat from the sense resistor layer 500 to thethermal cage layer 504. Like the thermally conductive cage layer 504,the thermally conductive vias 506 can be relatively more thermallyconductive than either or both of the layers 500, 502. In this way, heatfrom the sense resistor 102 can be transmitted through the thermallyconductive vias 506 to the thermally conductive cage layer 504, and thenplanarly spread across the gain-setting resistor 102 in all directions(such as via the planar thermal conductor provided by the thermal cagelayer 504). This can help provide good thermal coupling between thesense resistor 100 and the gain-setting resistor 102. An electricallyinsulating gap 512 can be provided, such as between electrically andthermally conductive portions of the thermal cage layer 504, such as toavoid electrically shorting either or both of the sense resistor 100 orthe gain-setting resistor 102 through electrical conduction through thevi as 506 and through the thermal cage layer 504, which could otherwiseoccur in the absence of such a gap 512.

FIG. 6 shows a cross-sectional view further illustrating or buildingupon certain aspects of FIG. 5. In the example of FIG. 6, the currentsense resistor 100 of resistance R is shown as the copper (or otherelectrically conductive) shunt layer 601 facing toward the bottom of thelayered structure as shown in FIG. 6, such as can be mounted andconnected to desired regions of an underlying motherboard PCB, such asvia the solder balls 610 shown in FIG. 6. This copper shunt layer 601can be formed upon an insulating PCB substrate material layer 600 (e.g.,FR-4 fiberglass-reinforced epoxy laminate material, or BT-epoxyinsulating laminate substrate material). In FIG. 6, the combination ofthe copper sense resistor layer 601 formed upon the insulating substratematerial layer 600 is shown after being turned over such that the coppershunt layer 601 is facing toward the bottom of the layered structure ofFIG. 6, and after thermally conductive (e.g., copper or the like) vias506 have been formed at desired locations (see, e.g., FIG. 5) throughthe insulating substrate material layer 600, on the other side of whichthe larger-resistance (serpentine or other shape) gain-setting resistor102 has been formed in (or placed against) a layer 603. The thermallyconductive vias 506 can further extend through a second insulatingsubstrate material layer 604 (e.g., PCB or laminate) that can be locatedabove the gain-setting resistor layer 603, with the gain-settingresistor layer 603 formed or placed against the underside of such secondinsulating substrate layer 604. In FIG. 6, above and upon the secondinsulating substrate layer 604 a thermally conductive (e.g., copper orthe like) thermal cage layer 504 material can be formed, such as with anelectrically non-conductive gap 512 formed therein, such as explainedabove. Because the large system current flows through the current senseresistor 100, it will generate heat in the current sense resistor layer601. Such generated heat can be thermally conducted via the thermallyconductive vias 506 to the thermally conductive thermal cage layer 504material. This can spread the heat of the current sense resistor 100,such as to surround the gain-selling resistor 102 from above and below,thereby thermally coupling the current sense resistor 100 and thegain-setting resistor 102. As shown in FIG. 5, a further PCB layer 508can be placed above the thermal cage layer 504 (or above the layer 504as shown in FIG. 6), and such further PCB layer 508 can be selectivelyconfigured with electrically conductive traces, pads, or the like, suchas within or to which other components can be located or placed upon.For example, the amplifier 104, decoupling capacitors, the FET or othertransistor 106, a power supply voltage regulator, or one or more othercomponents can be mounted to such a further PCB layer 508. Further, asshown in FIG. 6, the entire assembly can optionally be packaged into acomponent module and can be mounted via the solder balls 610 or othertechnique to a further motherboard PCB or other component of a system,as desired.

FIG. 5 also shows examples of linear electrically and thermallyconductive side or end traces 510, such as on two or more (e.g., four)opposing sides of the serpentine gain-setting resistor 102. In anexample, the thermally conductive vias 506 can pass vertically throughsuch side or end traces 510 between layers, such as at recurrent,periodic, or closely spaced locations through the insulating layers 600,602. This can help promote fast and uniform heat conduction from thecurrent sense resistor 100 to the thermal cage layer 504, which can helpkeep the intervening gain-setting resistor 102 at the same or a verysimilar temperature to that of the current sense resistor 100. Examplesof thicknesses involved in the structures shown and described withrespect to FIGS. 5-6 can include 35-50 micrometer thick insulatinglaminate layers, with 20-30 micrometer thick thermally and electricallyconductive metal layers, such as shown, such as to yield a totalcomponent thickness of approximately 320 micrometers. A similar approachcan use thicker PCB layers instead of thinner laminate layers, with atotal component thickness of approximately 1/16 inch.

Because the current sense resistor 100 and the gain-setting resistor 102can be thermally-coupled, such as using a thermal cage approach such asshown and described herein, these resistors 100, 102 will be at similartemperatures during operation, and this will be true over the usableoperational life of the component as well. Therefore, any componentaging effects of the resistors 100, 102 that depend upon temperature ortemperature cycling will affect these resistors 100, 102 similarly.However, since the current sensing and measurement accuracy depends uponthe ratio of these two resistance values of the resistors 100, 102, suchtemperature-dependent aging effects should affect both of theseresistors 100, 102 equally or similarly, but component aging is notexpected to affect the ratio of these resistance values, thereby helpingpreserve accuracy of the current sensing and measurement as thecomponent or assembly ages.

FIG. 7 shows an example of prototype experimental test results of outputcurrent, lout (in milliamperes) measured at the terminal IOUT vs. systemcurrent (amperes) flowing between terminals IP and IM, for fivedifferent prototype parts.

This shows good linearity, but some gain error related to the physicalmatching between the current sense resistor 100 (of resistance R) andthe gain-setting resistor 102 (of resistance n·R).

FIG. 8 shows an example of a graph of results of testing of suchprototype experimental parts, with the y-axis of the graph representingpercent error to an ideal straight line fit of output current, Iout, (inmilliamperes) vs. the x-axis representing system current (amperes)between terminals IP and IM, for five different prototype parts. Thedata shown in FIG. 8 shows good linearity.

Some Examples of Other Variations, Applications, or Uses

Since all the circuitry shown in the example of FIG. 1 “rides along”relative to the IP/IM voltage rail (e.g., the upper power supply rail ofthe amplifier 104 is biased by the IM terminal, and the lower powersupply rail of the amplifier 104 is at GND and the IOUT terminal canalso be biased as desired with respect to the upper power supply rail ofthe amplifier 104), the current sense circuitry of FIG. 1 can be placedanywhere in a particular system. Although primarily shown in FIG. 1 asintending to provide high-side current sense circuitry, a similarcurrent sense architecture and circuitry can be used to provide low-side(or even negative voltage) current sensing, such as with proper biasingof the amplifier 104 circuit shown in FIG. 1. The output current at theterminal IOUT can be configured to either source or sink current, againwith proper biasing of the amplifier 104 circuit and proper selection oftransistor 106 type (e.g., NFET vs. PFET).

The circuit shown in the example of FIG. 1 can operate independently ofvoltage between IP/IM and GND. So long as the amplifier 104 (or avoltage regulator powering the amplifier 104) and the output transistor106 can stand off the voltage between IP/IM and GND, and there issufficient voltage headroom to allow the amplifier 104 and output FET106 to operate, the circuit shown in the example of FIG. 1 can be usedwith any upper voltage rail, including 12V, 48V, 54V, or even 300V orhigher.

An additional resistor can optionally be included between IOUT and GND,such as can permit the circuit shown in the example of FIG. 1 to outputa voltage (e.g., taken across all or a portion of such additionalresistor) instead of a current. Additionally, the IOUT output currentcan be digitized, such as by including an analog-to-digital convertercircuit on the device with the circuit shown in the example of FIG. 1,such that a digital output, representative of such current, can hegenerated. This can help permit one or more other quantities, such asinput voltage, power, or energy to also be measured and calculated.

The above description includes references to the accompanying drawings,which form a part of the detailed description. The drawings show, by wayof illustration, specific embodiments in which the invention can bepracticed. These embodiments are also referred to herein as “examples.”Such examples can include elements in addition to those shown ordescribed. However, the present inventors also contemplate examples inwhich only those elements shown or described are provided. Moreover, thepresent inventors also contemplate examples using any combination orpermutation of those elements shown or described (or one or more aspectsthereof), either with respect to a particular example (or one or moreaspects thereof), or with respect to other examples (or one or moreaspects thereof) shown or described herein.

In the event of inconsistent usages between this document and anydocuments so incorporated by reference, the usage in this documentcontrols.

In this document, the terms “a” or “an” are used, as is common in patentdocuments, to include one or more than one, independent of any otherinstances or usages of “at least one” or “one or more.” In thisdocument, the term “or” is used to refer to a nonexclusive or, such that“A or B” includes “A but not B,” “B but not A,” and “A and B,” unlessotherwise indicated. In this document, the terms “including” and “inwhich” are used as the plain-English equivalents of the respective terms“comprising” and “wherein.” Also, in the following claims, the terms“including” and “comprising” are open-ended, that is, a system, device,article, composition, formulation, or process that includes elements inaddition to those listed after such a term in a claim are still deemedto fall within the scope of that claim. Moreover, in the followingclaims, the terms “first,” “second,” and “third,” etc. are used merelyas labels, and are not intended to impose numerical requirements ontheir objects.

Geometric terms, such as “parallel”, “perpendicular”, “round”, or“square”, are not intended to require absolute mathematical precision,unless the context indicates otherwise. Instead, such geometric termsallow for variations due to manufacturing or equivalent functions. Forexample, if an element is described as “round” or “generally round,” acomponent that is not precisely circular (e.g., one that is slightlyoblong or is a many-sided polygon) is still encompassed by thisdescription. The term “coupled” can include both direct and indirectelectrical interconnections that can be regarded as providing thedescribed operative functional coupling.

Method examples described herein can be machine or computer-implementedat least in part. Some examples can include a computer-readable mediumor machine-readable medium encoded with instructions operable toconfigure an electronic device to perform methods as described in theabove examples. An implementation of such methods can include code, suchas microcode, assembly language code, a higher-level language code, orthe like, Such code can include computer readable instructions forperforming various methods. The code may form portions of computerprogram products. Further, in an example, the code can be tangiblystored on one or more volatile, non-transitory, or non-volatile tangiblecomputer-readable media, such as during execution or at other times.Examples of these tangible computer-readable media can include, but arenot limited to, hard disks, removable magnetic disks, removable opticaldisks (e.g., compact disks and digital video disks), magnetic cassettes,memory cards or sticks, random access memories (RAMs), read onlymemories (ROMs), and the like.

The above description is intended to be illustrative, and notrestrictive. For example, the above-described examples (or one or moreaspects thereof) may be used in combination with each other. Otherembodiments can be used, such as by one of ordinary skill in the allupon reviewing the above description. The Abstract is provided to allowthe reader to quickly ascertain the nature of the technical disclosure.It is submitted with the understanding that it will not be used tointerpret or limit the scope or meaning of the claims. Also, in theabove Detailed Description, various features may be grouped together tostreamline the disclosure. This should not be interpreted as intendingthat an unclaimed disclosed feature is essential to any claim. Rather,inventive subject matter may lie in less than all features of aparticular disclosed embodiment. Thus, the following claims or aspectsare hereby incorporated into the Detailed Description as examples orembodiments, with each claim or aspect standing on its own as a separateembodiment, and it is contemplated that such embodiments can be combinedwith each other in various combinations or permutations. The scope ofthe invention should be determined with reference to the appended claimsor aspects, along with the full scope of equivalents to which suchclaims or aspects are entitled.

1. A system current sensor module for accurately performing at least oneof a current sensing or measurement of a system current, the sensormodule comprising: an input node, an output node, and a system currenttest node; a first resistor coupled between the input and output nodes;a second resistor coupled between the input ode and the test node; anoutput transistor in series between the second resistor and the testnode; an amplifier, including a first amplifier input coupled to theoutput node, a second amplifier input coupled to the second resistor,and an amplifier output coupled to a control node of the transistor; andwherein the first and second resistors are thermally coupled to keep atemperature of the second resistor at or near a temperature of the firstresistor when a system current is flowing through the first resistor andheating the first resistor.
 2. The current sensor module of claim 1,comprising a thermal cage thermally coupling the first and secondresistors, the thermal cage including: a thermally conductive sheetlocated on a first side of a second resistor sheet layer carrying thesecond resistor; and a first resistor sheet layer, carrying the firstresistor, located on an opposing second side of the second resistorsheet layer, carrying the second resistor, from the thermally conductivesheet.
 3. The current sensor module of claim 2, further comprising oneor more thermally conductive paths extending between the first resistorsheet layer and the thermally conductive sheet layer.
 4. The currentsensor module of claim 3, further comprising, one or more thermallyinsulating layers through which the one or more thermally conductivepaths extend.
 5. The current sensor module of claim 4, wherein thesecond resistor sheet layer includes laterally opposing first and secondend traces through which one or more of the thermally conducting pathsextend.
 6. The current sensor module of claim 1, further comprising acomponent layer separated from the second resistor by a thermallyconductive sheet.
 7. The current sensor module of claim 1, furthercomprising one or more solder balls or other electrical interconnectionsto at least one of the first and second resistors for attachment toanother component, module, or printed circuit board.
 8. The currentsensor module of claim 7, in combination with a motherboard coupled tothe current sensor module via the one or more solder balls or otherelectrical interconnections.
 9. The current sensor module of claim 1,wherein the output transistor includes a plurality of parallel outputtransistors with individually selectable paths that determine which ofthe output transistors contribute current to the test node.
 10. Thecurrent sensor module of claim 1, wherein the second resistor comprisestap locations selectively coupled to the second amplifier input.
 11. Thecurrent sensor module of claim 1, wherein the second resistor comprisesfirst and second series-connected components, and wherein the secondseries-connected component of the second resistor comprises one or moretap locations selectively coupled to the second amplifier input.
 12. Thecurrent sensor module of claim 1, wherein the second resistor comprisesa first and second series-connected components, and wherein the secondseries-connected component of the second resistor is electricallyconnected in parallel with a shunt resistor that provides one or moretap locations to be selectively coupled to a second amplifier input viaa multiplexer circuit.
 13. The current sensor module of claim 1, whereinthe first and second resistors are located in separate layers that arethermally coupled to each other.
 14. The current sensor module of claim1, wherein the separate layers include at least one of PCB layers orother laminate layers.
 15. The current sensor module of claim 1, whereinthe first and second resistors are located in separate layers at leastone of which is thermally coupled in an at least partiallyperipherally-distributed manner to an additional thermally conductivelayer for distributing heat via the additional thermally conductivelayer.
 16. A method of sensing or measuring a system current comprising:in response to a system current flowing between an input node and anoutput node via a first resistor, shunting a measurement current via asecond resistor to a test node; measuring a voltage across the secondresistor using an amplifier that is configured in a closed feedback loopto control the current through the second resistor in a manner thattends to reduce or minimize a voltage difference across first and secondinputs of the amplifier; and wherein the measuring includes usingthermally coupled first and second resistors.
 17. The method of claim16, wherein using thermally coupled first and second resistors forconducting heat from a first resistor layer carrying the first resistorto a thermally conductive thermal cage layer located beyond a secondresistor layer carrying the second resistor.
 18. The method of claim 16,wherein using thermally coupled first and second resistor layers furthercomprises spreading heat in the thermal cage layer across a region thatis located in layered registration to the second resistor.
 19. A systemcurrent sensor module for accurately performing at least one of acurrent sensing or measurement of a system current, the sensor modulecomprising: an input node, an output node, and a system current testnode; a first resistor and a second resistor arranged in a feedbackconfiguration to provide a gain (n) between a system load current and atest output current based on a ratio of resistance values of the firstresistor and the second resistor; and means for thermally coupling thefirst and second resistors to keep a temperature of the second resistorat or near a temperature of the first resistor when a system current isflowing through the first resistor and heating the first resistor. 20.The sensor module of claim 19, wherein the means for thermally couplingthe first and second resistors includes the first and second resistorsbeing respectively located in separate PCB or other laminate layers thatare thermally coupled to each other, and wherein the first and secondresistors are thermally coupled for conducting heat from a firstresistor layer carrying the first resistor to a thermally conductivethermal cage layer located beyond a second resistor layer carrying thesecond resistor.
 21. The current sensor module of claim 1, comprising athermal cage thermally coupling the first and second resistors, thethermal cage including: a thermally conductive sheet located on a firstside of a second resistor sheet layer carrying the second resistor; anda first resistor sheet layer, carrying the first resistor, located on anopposing second side of the second resistor sheet layer, carrying thesecond resistor, farther from the thermally conductive sheet than thesecond resistor sheet layer carrying the second layer.
 22. The currentsensor module of claim 21, wherein the first and second resistor sheetlayers are thermally and electrically connected to the thermallyconductive sheet layer by first and second sets of peripheral vi asalong corresponding first and second edges of the first and secondresistor sheet layers, and wherein the thermally conductive sheet layerincludes an electrically insulating portion inhibiting electricalconduction from the first set of peripheral vi as to the second set ofperipheral vias within the thermally conductive sheet layer.
 23. Thecurrent sensor module of claim 2, wherein the first resistor sheetlayer, the second resistor sheet layer, and the thermally conductivesheet are respective printed circuit board (PCB) layers in a PCB.